JEOL xCLent
xCLent integrates
cathodoluminescence (CL) spectrometry with x-ray mapping on
JEOL electron microprobes. The cathodoluminescence signal is
collected through the light optics of the electron microprobe
using a modified optical assembly, and is analysed using an
external Peltier cooled linear
CCD spectrometer. The
spectrometer collects and measures CL from 200 - 950 nm, with
high sensitivity. In mapping mode, the full
CL spectrum is recorded at
each point in the map, in parallel with the x-ray and electron
signals that are collected by the microprobe.
Cathodoluminescence acquisition can be synchronised with
either beam or stage mapping, with typical map sizes range
from one million to ten million pixels, and dwell times range
from 10ms to 300ms per pixel, typically 20ms is employed.
Spectral
cathodoluminescence mapping of quartz grains (SiO2)
using the xCLent Server .
The map and spectral data is collected by the XCLent
Server software, and may be analysed off-line on a
PC using the
XCLent Image software. xCLent Image supports
the following features:
- Display of maps of elemental
concentrations (k-ratios), cathodoluminescence intensity
(either channels or bands), or electron signals.
- Display of composite maps, with the primary colour
components (red, green, blue) generated from up to three
different elements or CL
channels/bands (see example image below).
- Display of scatter plots to show correlations between
different elements or CL
channels/bands.
- Identification of CL
emission lines using a database of luminescence emission
lines from a range of minerals and materials.
- Deconvolution of
cathodoluminescence spectra using Gaussian peak fitting.
- Fitted cathodoluminescence lines may be calibrated using
elemental analyses from EPMA or LA ICP-MS, where the lines
are associated with a known transitions and free from
quenching or other non-linear effects.
Analysis
and presentation of maps and spectra in xCLent Image.
Specifications
Hardware
- Peltier cooled CCD spectrometer.
- Fibre optic with SMA connectors.
- Collimating lens and coupling to
JEOL optical assembly.
-
PC running
Microsoft Windows to control capture and display
data.
Software
- xCLent Server
- Control software for CCD spectrometer
acquisition, and synchronisation with x-ray mapping.
- Supports both beam and stage scan
mapping.
- Realtime spectrum view mode
during mapping.
- Spectrum view mode for optical alignment.
- xCLent Image
- Visualisation software for displaying combined x-ray
and cathodoluminescence maps, elemental scatter plots,
elemental ternary diagrams, line profiles,
etc.
Options
- Additional PCs
for off-line analysis of data whilst the microprobe is
collecting maps.
- Additional spectrometers with optimised optical response
for studying specific customer problems.
Please see Downloads section for Application
notes
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