JEOL Ltd. (Gon'emon Kurihara, President) announced a new transmission electron microscope, JEM-ARM200F, incorporating a spherical aberration corrector for the electron optic system as standard, to be distributed in March 2009.

[Background]

Transmission electron microscopes are designed to study the geometry and structure of substances at high resolution. They can also analyse the elements constituting substances and the status of electrons by incorporating various analysers such as energy dispersive X-ray fluorescent spectrometer (EDS) and electron beam energy loss spectrometer (EELS).

A new technology has recently been introduced to correct spherical aberrations that have long restricted the resolving power of electron microscopes. Spherical aberration correctors significantly enhance the resolution and analytical capabilities, enabling ultimate atomic level analysis. The JEM-ARM200F is a powerful transmission electron microscope with a standard spherical aberration corrector, featuring sub angstrom resolution and atomic level analysis.

[Features]

• Atomic level resolution -  STEM: 0.08 nm; TEM: 0.11 nm
• Standard spherical aberration corrector for electron optic system eliminating spherical aberrations
• Maximum accelerating voltage 200 kV

[Specifications]

* Dark field ring detector used